Filtros : " IFSC225" "Expert Systems with Applications" Removidos: "IQSC-IQSC" "Almeida, Claudia Nascimento de" "Scopim, Valéria" Limpar

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  • Source: Expert Systems with Applications. Unidade: IFSC

    Subjects: APRENDIZADO COMPUTACIONAL, PROCESSAMENTO DE IMAGENS

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    • ABNT

      CASTRO, Lucas Daniel Chiba de et al. Machine learning and image processing to monitor strain and tensile forces with mechanochromic sensors. Expert Systems with Applications, v. 212, p. 118792-1-118792-7, 2023Tradução . . Disponível em: https://doi.org/10.1016/j.eswa.2022.118792. Acesso em: 15 maio 2024.
    • APA

      Castro, L. D. C. de, Scabini, L. F. dos S., Ribas, L. C., Bruno, O. M., & Oliveira Junior, O. N. de. (2023). Machine learning and image processing to monitor strain and tensile forces with mechanochromic sensors. Expert Systems with Applications, 212, 118792-1-118792-7. doi:10.1016/j.eswa.2022.118792
    • NLM

      Castro LDC de, Scabini LF dos S, Ribas LC, Bruno OM, Oliveira Junior ON de. Machine learning and image processing to monitor strain and tensile forces with mechanochromic sensors [Internet]. Expert Systems with Applications. 2023 ; 212 118792-1-118792-7.[citado 2024 maio 15 ] Available from: https://doi.org/10.1016/j.eswa.2022.118792
    • Vancouver

      Castro LDC de, Scabini LF dos S, Ribas LC, Bruno OM, Oliveira Junior ON de. Machine learning and image processing to monitor strain and tensile forces with mechanochromic sensors [Internet]. Expert Systems with Applications. 2023 ; 212 118792-1-118792-7.[citado 2024 maio 15 ] Available from: https://doi.org/10.1016/j.eswa.2022.118792

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